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Estimates of mineral abundances based on Rietveld refinement of X-ray diffraction data from mill tailings and other ore processing materials

This worksheet displays the results of mineral abundance estimates based on Rietveld refinement of X-ray diffraction (XRD) analyses of mill tailings and other ore processing materials from worldwide localities. Data are also provided to show variation in mineral abundance estimates for subsplits in individual samples. Samples were analyzed using a PANalytical X'Pert Pro diffractometer using Cu radiation and the results interpreted using Highscore Plus v.4.7.

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Author(s) Carlin J Green orcid, Robert R Seal orcid, Nadine Piatak orcid
Publication Date 2020-01-03
Beginning Date of Data 2007
Ending Date of Data 2019
Data Contact
DOI https://doi.org/10.5066/P9IWPGM7
Citation Green, C.J., Seal, R.R., and Piatak, N., 2020, Estimates of mineral abundances based on Rietveld refinement of X-ray diffraction data from mill tailings and other ore processing materials: U.S. Geological Survey data release, https://doi.org/10.5066/P9IWPGM7.
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Metadata Date 2020-08-19
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Citations of these data No citations of these data are known at this time.
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License http://www.usa.gov/publicdomain/label/1.0/
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Harvest Source: ScienceBase
Harvest Date: 2024-10-03T04:58:26.199Z