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Interpretation of the thickness of Quaternary deposits on the inner-continental shelf within the New York Bight, derived from seismic data collected by the U.S. Geological Survey, 1995 - 1999 (Grid, UTM Zone 18N, WGS84 and Esri polyline shapefile, Geographic, WGS84)
Mapping the thickness of the Quaternary sediment is useful for delineating the geologic framework of the New York Bight inner-continental shelf. This in turn aids in understanding the stratigraphic evolution of the inner-continental shelf, the regional sediment transport system, and the influence of the inner-shelf framework on coastal processes. The grid showing the thickness of Quaternary sediment is an important factor in the framework of the coastal region.
Author(s) | Jane F. Denny, David S. Foster, William C. Schwab, B. Ann Swift |
Publication Date | 2002 |
Beginning Date of Data | 1995-05-01 |
Ending Date of Data | 1998-11-01 |
Data Contact | |
DOI | This item doesn't have a registered DOI. |
Citation | Check repository for data citation. |
Metadata Contact | |
Metadata Date | 2024-03-18 |
Related Publication | There was no related primary publication associated with this data release. |
Citations of these data | No citations of these data are known at this time. |
Access | public |
License | http://www.usa.gov/publicdomain/label/1.0/ |
Harvest Date: 2025-01-22T04:21:20.072Z