Swayze, Gregg A.
20180124
Spectral Parameter Tables for Expanded Vermiculite Samples
CSV
Denver, CO
U.S. Geological Survey
https://doi.org/10.5066/F7JM27SR
Gregg, Swayze A.
Lowers, Heather A.
Benzel, William M.
Clark, Roger N.
Driscoll, Rhonda L.
Perlman, Zac S.
Hoefen, Todd M.
Dyar, M. Darby
2018
Characterizing the source of potentially asbestos-bearing commercial vermiculite insulation using in situ IR spectroscopy
Report
Washington, D.C.
American Mineralogist
http://doi.org/10.2138/am-2018-6022
This dataset contains spectral parameters for absorption features found in reflectance spectra of expanded vermiculite samples. These data are provide for 52 samples of vermiculite attic insulation, horticultural products, aggregate, and packing materials derived from mines near Enoree, South Carolina; Libby, Montana; Louisa, Virginia; Palabora, South Africa; and Jiangsu, China collected from 2000 to 2016. Also included are two tables listing the spectral parameters for reflectance spectra of four expanded vermiculite samples selected to represent each of the four main historical sources of vermiculite (e.g., Libby, Montana; Enoree, South Carolina; Louisa, Virginia; and Palabora, South Africa) taken at normal spectral resolution (11 to 12 nm full width half maxiumum) and finer resolution (6nm fwhm). A third table lists the spectral parameters of spectra convolved to 11 to 12nm fwhm from the original 6nm fwhm data. Spectral parameters such as band depth were calculated by dividing the reflectance value of each spectral channel in an absorption by the corresponding reflectance value of a continuum drawn between endpoints on the shoulders of the absorption. The minimum channel of the continuum-removed data is found between the continuum endpoints, and a parabola is statistically fit to it and the two channels nearest to this minimum. The reflectance of the parabola’s center wavelength is determined, and then subtracted from 1.00 to derive the band depth of the absorption. Columns M and N list the x and y values of the contaminant non-detect line whose position passes through those samples that contain only minor to trace levels of contaminants in their sink fractions or have no Scanning Electron Microscopic evidence of contaminants (e.g., talc, amphibole, or serpentine).
Data were obtained to develop an in situ spectral technique to identify the provenance (e.g., source) for use by inspectors and laboratories for identifying potentially asbestos-bearing vermiculite insulation in buildings and homes.
2000
2016
ground condition
Not planned
-128.7597656235
-62.490234376141
49.922653763102
23.684373489276
none
Vermiculite insulation
expanded vermiculite
reflectance spectroscopy
elongate amphiboles
Libby
provenance
VSPEC technique
electron probe microanalysis
spectroscopy
Crustal Geophysics and Geochemistry Science Center
CGGSC
Central Minerals and Environmental Resources Science Center
CMERSC
Mineral Resources Program
MRP
ISO 19115 Topic Categories
geoscientificInformation
environment
USGS Thesaurus
scanning electron microscopy
electron probe microanalysis
chemical analysis
mineralogy
x-ray diffraction
mineral deposits
USGS Metadata Identifier
USGS:58797da0e4b0847d353f404d
Geographic Names Information System (GNIS)
Enoree
South Carolina
Libby
Montana
Louisa
Virginia
GEOnet Names Server (GNS)
Palabora
South Africa
Jiangsu
China
none
There is no guarantee concerning the accuracy of the data. Any user who modifies the data is obligated to describe the types of modifications they perform. Data have been checked to ensure the accuracy. If any errors are detected, please notify the originating office. The U.S. Geological Survey strongly recommends that careful attention be paid to the metadata file associated with these data. Acknowledgment of the U.S. Geological Survey would be appreciated in products derived from these data. User specifically agrees not to misrepresent the data, nor to imply that changes made were approved or endorsed by the U.S. Geological Survey. Please refer to http://www.usgs.gov/privacy.html for the USGS disclaimer.
Gregg Swayze
U.S. Geological Survey
mailing and physical
Bldg 20, PO Box 25046, MS 964, Denver Federal Center
Denver
CO
80225
USA
303-236-0925
gswayze@usgs.gov
This release of the dataset was funded by the U.S. Geological Survey Mineral Resources Program (MRP).
No formal attribute accuracy tests were conducted
No formal logical accuracy tests were conducted
Data set is considered complete for the information presented, as described in the abstract. Users are advised to read the rest of the metadata record carefully for additional details.
No formal positional accuracy tests were conducted
No formal positional accuracy tests were conducted
Lowers, H.A., and Meeker, G.P.
2004
Electron probe microanalysis as a tool for identifying vermiculite sources
Table
Cambridge University Press
Microscopy Society of America
https://www.sciencebase.gov/catalog/item/505a08a9e4b0c8380cd51bf7
Electron Probe MicroAnalysis
20040101
20041231
20161221
EPMA
Helped determine the origin of expanded vermiculite samples
Reflectance measurements of vermiculite samples were made with ASD (PANalytical) FieldPro® and FieldSpec® Spectrometers over the wavelength range from 0.35 to 2.5 μm using a contact probe for illumination and Spectralon® disk for reference. They were collected with 2.1 nm sampling interval (resampled to 1 nm by the software) and 11 to 12 nm bandpass (FWHM) over the 1 to 2.5 μm spectral range. Measurements were repeated up to 40 times while shifting the contact probe to cover previously unmeasured flakes. These spectra were converted to absolute reflectance using a modified NIST-traceable Spectralon® reflectance spectrum supplied with the Spectralon® panel by Labsphere, Inc. Wavelength positions are accurate to < 1 nm based on annual calibrations done at the ASD (PANalytical) facility and independently verified by the USGS using measurements of well-characterized sharp spectral features in a Corning® REE-doped glass CG 5121, a clear mylar sheet, and NIST wavelength standard SRM 2035.
2016
Sample collection location (e.g., city) is given for each sample; otherwise the city of product purchase or manufacture is provided when available. Exact sample locations are unavailable.
vermiculite_insulation_spectral_parameter_table.csv
Vermiculite insulation spectral parameter table
U.S. Geological Survey
Sample_Name
Unique name assigned to each sample
U.S. Geological Survey
Field content described in attribute definition.
Sample_number
Unique identifier assigned to each sample
U.S. Geological Survey
Field content described in attribute definition.
1.38um_depth
Continuum removed band depth of the 1.38 micron absorption
U.S. Geological Survey
0
0.0191
unitless
1.40um_depth
Continuum removed band depth of the 1.40 micron absorption
U.S. Geological Survey
0.0014
0.0254
unitless
1.42um_depth
Continuum removed band depth of the 1.42 micron absorption
U.S. Geological Survey
0.0007
0.0281
unitless
2.24um_depth
Continuum removed band depth of the 2.24 micron absorption
U.S. Geological Survey
0
0.0376
unitless
2.24um_band_wavelength
Wavelength position of the 2.24 micron; -9999 represents non-detection
of this absorption in a given sample
U.S. Geological Survey
-9999
2.2479
microns
2.32um_depth
Continuum removed band depth of the 2.32 micron absorption
U.S. Geological Survey
0.0837
0.2357
unitless
2.38um_depth
Continuum removed band depth of the 2.38 micron absorption
U.S. Geological Survey
0.0109
0.0774
unitless
1.38/2.32um_depth_ratio
Ratio of the continuum removed band depth of the 1.38- and 2.32-micron
absorptions
U.S. Geological Survey
0
0.111570248
unitless
1.4/1.42um_depth_ratio
Ratio of the continuum removed band depth of the 1.4- and 1.42-micron
absorptions
U.S. Geological Survey
0.429487179
5.571428571
unitless
2.24/2.38um_depth_ratio
Ratio of the continuum removed band depth of the 2.24- and 2.38-micron
absorptions
U.S. Geological Survey
0
2.320987654
unitless
non_detect_curve_1.38/2.32_axis_values
1.38/2.32 micron band depth axis values for non-detection curve below
which no amphibole, talc, or serpentine is spectrally detectable. Values generated at a fine interval using a nonlinear curve fitting algorithm are independent of individual sample parameter values.
U.S. Geological Survey
0
0.020778516
unitless
non_detect_curve_1.4/1.42_axis_values
1.4/1.42 micron band depth axis values for non-detection curve below
which no amphibole, talc, or serpentine is spectrally detectable. Values generated at a fine interval using a nonlinear curve fitting algorithm are independent of individual sample parameter values.
U.S. Geological Survey
0.45
0.475379226
unitless
vermiculite_insulation_spectral_parameter_res
Spectral parameter tables for high resolution (expanded_vermiculite_spectral_parameter_high_resolution_table.csv), non-high resolution (expanded_vermiculite_spectral_parameter_low_resolution_table.csv), and high resolution convolved to non-high resolution measurements (expanded_vermiculite_spectral_parameters_high_resolution_convolved_to_low_resolution_data_table.csv)
U.S. Geological Survey
Sample_Name
Name of expanded vermiculite sample
U.S. Geological Survey
Field content described in attribute definition.
Sample_number
Sample number assigned to expanded vermiculite sample
U.S. Geological Survey
Field content described in attribute definition.
1.38um_depth
Continuum removed band depth of the 1.38 micron absorption
U.S. Geological Survey
0
0.032
unitless
1.40um_depth
Continuum removed band depth of the 1.40 micron absorption
U.S. Geological Survey
0.0016
0.0273
unitless
1.42um_depth
Continuum removed band depth of the 1.42 micron absorption
U.S. Geological Survey
0.0013
0.0193
unitless
2.24um_depth
Continuum removed band depth of the 2.24 micron absorption
U.S. Geological Survey
0
0.0331
unitless
2.24um_band_wavelength
Wavelength position of the 2.24 micron; -9999 represents non-detection
of this absorption in a given sample
U.S. Geological Survey
-9999
2.2473
microns
2.32um_depth
Continuum removed band depth of the 2.32 micron absorption
U.S. Geological Survey
0.121
0.1829
unitless
2.38um_depth
Continuum removed band depth of the 2.38 micron absorption
U.S. Geological Survey
0.0105
0.0625
unitless
1.38/2.32um_depth_ratio
Ratio of the continuum removed band depth of the 1.38- and 2.32-micron
absorptions
U.S. Geological Survey
0
0.203045685
unitless
1.4/1.42um_depth_ratio
Ratio of the continuum removed band depth of the 1.4- and 1.42-micron
absorptions
U.S. Geological Survey
0.615942029
1.456521739
unitless
2.24/2.38um_depth_ratio
Ratio of the continuum removed band depth of the 2.24- and 2.38-micron
absorptions
U.S. Geological Survey
0
2.648
unitless
U.S. Geological Survey – ScienceBase
U.S. Geological Survey – ScienceBase
mailing and physical
Building 810, Mail Stop 302, Denver Federal Center
Denver
CO
80225
USA
1-888-275-8747
sciencebase@usgs.gov
Unless otherwise stated, all data, metadata and related materials are considered to satisfy the quality standards relative to the purpose for which the data were collected. Although these data and associated metadata have been reviewed for accuracy and completeness and approved for release by the U.S. Geological Survey (USGS), no warranty expressed or implied is made regarding the display or utility of the data on any other system or for general or scientific purposes, nor shall the act of distribution constitute any such warranty.
20200929
Swayze, Gregg A.
U.S. Geological Survey
Research Geophysicist
mailing and physical
Bldg 20, PO Box 25046, MS 964, Denver Federal Center
Denver
CO
80225
USA
303-236-0925
gswayze@usgs.gov
Content Standard for Digital Geospatial Metadata
FGDC-STD-001-1998